Abstract
The mechanical response to electrical stimulation was investigated in a chiral smectic elastomer. The two-dimensional strain tensor in an elastomer film was precisely measured by tracking fluorescent beads dispersed on the film. Shear deformation in the film was clearly observed when an electric field was applied perpendicular to the film surface. The temperature dependence of the strain tensor was also investigated, and the origin of the electric-field-induced shear strain in the chiral smectic C phase was mainly attributed to the Nambu-Goldstone mode.
