2a02 Measurement technique about image-sticking for FFS mode

Abstract

We developed image-sticking measuring technique for Fringe-Field-Switching (FFS) mode, and have developed materials. In FFS mode, electric field strength near electrode edge is strong, and various image-sticking occur. There are electrical factor and alignment factor in these image-sticking, and it is important for development of liquid crystal materials and alignment-film materials. We observed anchoring and easy axis stability about the alignment factor, and took notice of change of transmission and flicker about the electrical factor. We introduce the developed technique and some experimental data.