Abstract
The fabrication of operable surface-stabilized ferroelectric liquid crystals (SSFLCs) is often hampered by the occurrence of zigzag defects. In this study, we try to fabricate a defect-free SSFLC with antiparallel-rubbed films having different properties between two substrates for the energy condition in two types of chevron to be different. As a result, there is no relationship between the anchoring strength and the occurrence of zigzag defects. It is also contemplated in the current rubbing strength scratch to make the alignment film, and that this is related to the occurrence of defects.