PB51 Thickness Dependence on Viscoelasticity of Liquid Crystal Thin Film on a Solid Surface II

Abstract

It has been reported that liquid crystal thin films of 64 nm thick or thinner exhibited solid-like characteristics losing liquid crystallinity. In the present study, viscoelastic behavior in the re-evaporation process of liquid crystal thin films was investigated by using a quartz crystal microbalance (QCM). The results indicate a formation of a non-volatile layer restricted strongly by solid substrate in comparison with a solid-like interfacial layer.