Measurement of cell thickness and refractive index dispersion by interference method and birefringence method.

Abstract

In order to determine the cell thickness and the wavelength dispersion in Δn of liquidcrystal materials without additional light sources, the interference method and the bire-fringence method are discussed. The cell thickness values measured with the former method less deviate from each other than those with the latter method. The dispersion of Δn tend to deviate whenΔn is large.