Preprints of symposium on liquid crystals
Online ISSN : 2432-9959
Print ISSN : 1880-3539
ISSN-L : 1880-3539
19th Symposium on Liquid Crystals
Session ID : 2A03
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Smectic Layer Order Measurement by Higher Order X-ray Diffraction
*Yoichi TAKANISHIAsako IKEDAHideo TAKEZOEAtsuo FUKUDA
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CONFERENCE PROCEEDINGS FREE ACCESS

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© 1993 The Japanese Liquid Crystal Society
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