Characterization of the Local Layer Structure at the Narrow Wall in Surface Stabilized Ferroelectric Liquid Crystals using Synchrotron X-ray Micro-Diffraction

Abstract

The local layer structure(LLS) at the narrow wall (lightening) of the zigzag defect in surface stabilized ferroelectric liquid crystals was characterized using synchrotron X-ray micro-diffraction. An X-ray beam size used was 5 μm or 2.5 μm. A liquid crystal used was CS1014. The diffracted intensity was measured as functions of θ, χ and Y(position). At the narrow wall running parallel to the rubbing direction, the LLS was a pseudo- bookshelf structure with an angle of 16° between the layer normal and the rubbing direction. The bookshelf structure also bent in the θ direction. At the inclined narrow wall, the LLS showed a larger bend in θ direction as well as the inclination in χ direction. The layer normal made a larger angle with the rubbing direction.