1988 Volume 44 Issue 11 Pages 587-590
Study of X-ray photoelectron spectroscopy (XPS) has been made on the film of poly (hydroxypropyl ether of bisphenol A) (P)/Poly (methyl methacrylate) (M) blend formed on nylon-6 substrate to elucidate the boundary phase structure between the substrate and the polymer blend. It can be found by analysing the C1s spectrum that the boundary phase is almost composed of M alone. This result can be useful for fundamental information to understand the reinforcing mechanism of the Kevla ®-fiber reinforced composite made with P/M blend as matrix.