Determination of trace elements in rock samples by X-ray fluorescence

Abstract

Applicability of XRF to trace element analysis was examined. The Rb, Sr, Y, and Zr abundances in rock samples can be quantitatively determined if their abundances are more than 10ppm. The concentration of Nb necessary for quantitative analysis is 5 ppm. Provided that TiK_β interference is properly corrected, even less than 50ppm V can be determined. The intensities of Cr, Ni, Cu, and Zn are so low that 30ppm Cr is minimum abundance needed for determination and 40 ppm Ni, Cu, and Zn are also minimum concentrations necessary for analysis. The intensity of Ba is also low but the abundances in rock samples are mostly high enough for determination. An averaged result obtained from repeated analyses should be used in critical discussions to overcome the poor reproducibility for Ba determination.