2017 Volume 51 Issue 4 Pages 299-313
Secondary ion mass spectrometry (SIMS) is a powerful technique for measuring low-concentration volatile elements such as H, C, F, Cl, and S in micrometer-sized samples. The number of studies on volatiles in terrestrial and extraterrestrial materials using SIMS, particularly in volcanic glasses, has been rapidly increasing in the recent decade. Although SIMS has the capability of measuring volatile abundances at the level of parts per million (ppm) in samples, standard materials are required to obtain reliable datasets. We therefore prepared fourteen glass standards, including nine synthetic glasses and five natural glasses (0.02–4.8 wt% for H2O, 85–9400 ppm for CO2, 55–2957 ppm for F, 55–2833 ppm for Cl, and 51–1372 ppm for S), which covered the broad ranges of volatile contents in volcanic silicate glasses reported to date. H2O and CO2 concentrations of the glasses were determined by Fourier transform infrared spectroscopy (FTIR) and F, Cl, and S concentrations were determined by ion chromatography following pyrohydrolysis. Two SIMS instruments, NanoSIMS 50L and IMS-1280HR, were used to measure the volatile contents including H2O, CO2, F, Cl, and S in addition to the P2O5 content in a series of volatile standard silicate glasses together with four basaltic glass standards distributed by the United States Geological Survey for the P2O5 content. The 30Si-normalized intensities of volatile elements and 31P showed good correlations with volatile and P2O5 abundances in standard glasses in all ranges with the squared correlation coefficient (R2) > 0.996 except for CO2, where R2 = 0.992. We confirmed that most synthetic and natural glasses are of good quality for volatile standards of silicate glasses.