Journal of the Mineralogical Society of Japan
Online ISSN : 1883-7018
Print ISSN : 0454-1146
ISSN-L : 0454-1146
Characterization of Electron Device Crystals
Shin' Ichiro TAKASU
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1983 Volume 16 Issue 2 Pages 185-198

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Abstract
Modern electronics industry requires very many crystals. And the crystals must be characterized not only before using device process but also before their research and development. The first approach to crystal characterization starts with optical observation. The observation is originated from natural history including mineralogy and crystallography. The first step of optical observation is seeing outlook, and the second is sampling. If the sampling is not suitable, the following observation will be a waste of time.
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