Journal of the Mineralogical Society of Japan
Online ISSN : 1883-7018
Print ISSN : 0454-1146
ISSN-L : 0454-1146
Cell Parameters Refinement Using Guinier Method
Arashi KITAKAZE
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1996 Volume 25 Issue 2 Pages 69-76

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Abstract
The accurate X-ray powder data were obtained by a Guinier focusing camera method using monochromatized Xray radiation. The intensities and angles of X-ray diffractions on the Guinier film were measured by automated microphotomete rcontrolled by a personal computer. X-ray diffraction data were obtained by profile fitting employing an asymmetric pseudo-Voigt function of split type using non-linear least squares calculation. Using these data, the relative errors of the cell parameters were estimated to be less than 5·10-5.
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