Abstract of Papers Presented at Annual Meeting of the Gemmological Society of Japan
2010 Annual Meeting
Session ID : 13
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Examples of identification of gem using X-ray micro-diffraction
*Masahiko HayashiAtsushi Yamazaki
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Abstract
It is able to identify gem using X-ray powder diffraction pattern of approximately 4,600 species of the database of minerals. This method require pulverized gem.
Gem has to avoid destructive testing.
On the other hand X-ray micro-diffraction is widely known as an analytical instrument without the need for powder.
X-ray micro-diffraction will contribute in the gemmology.
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© 2010 The Gemmological Society of Japan
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