Abstract
In view of the beneficial effects of both fluorine(F) and silver(Ag) ion deposition by Plasma-based ion deposition(PBID), the aims of this study were to evaluate the depth profile of deposited dual elements and spectra of binding conditions by X-ray photoelectron spectroscopy (XPS), as well as evaluate the effect of dual ion implantation or deposition on contact angle. XPS analysis suggested that Ag was bound with Cr, and F was bound with Cr and carbon on the surface of SUS. Fluorine and silver ion deposited SUS surface showed a significantly higher contact angle than non-deposited or dual ion implanted surface.
The mentioned above, it was suggested that F and Ag deposition is available to the surface modification for prevention oral infection disease.