Challenges in Highly-reliable Crystal Structure Analysis of Synthetic Polymers based on the Organized Combination of Wide-Angle X-ray Diffraction and Wide-Angle Neutron Diffraction Methods.

Abstract

Various types of technique have been proposed for enhancement of reliability of crystal structure information of synthetic polymers. In particular, the organized combination of high-energy synchrotron X-ray and wide-angle neutron diffraction methods has allowed us to extract the exact hydrogen atomic positions of polymer crystals. The so-called X-N method has been applied for the first time to obtain the bonded electron density distribution of electronically-conjugated polymer system.