Ionizing Radiation
Online ISSN : 2758-9064
Development of Epitaxial Silicon Detectors
Kazuo Fusimi
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JOURNAL FREE ACCESS

1984 Volume 10 Issue 2-3 Pages 23-33

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Abstract

  Silicon radiation detectors produced by applying epitaxial crystal growth technique has made it possible to supply silicon wafers with multi-layer structure and this leads us possible to produce new types of silicon detectors. The epitaxial technique is well developed and widely used in semiconductor industries. This assures to produce good quality silicon wafers for detector use.

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