The development and applications of scattering Mössbauer spectrometry

Abstract

  Scattering Mössbauer spectrometry used for our study is reviewed. Simultaneous measurements of depth selective conversion electron Mössbauer spectrometry (DCEMS) and resonant X-ray Mössbauer spectrometry (XMS) have been realized by using a back scattered type of dual gas proportional counter. The magnetic moments of martensite films deposited by RF and DC sputtering are apt to be perpendicular and parallel to the surface, respectively. 4 nm-thick iron oxide and 10 μm-thick layers can be characterized by CEMS and XMS, respectively. The relative peak intensity of ferritic and austenitic phases in high tensile steel suggests that sulfurizing dissolves the ferrite selectively. On the other hand, nuclear resonant X-rays are discriminated from non-resonant prompt X-rays of synchrotron radiation on the base of lifetime of nuclear excitation. Properties of nuclear forward scattering and inelastic scattering are summarized. Phonon density of states of perovskite related oxides are calculated from inelastic nuclear scattering of synchrotron radiation. Some properties of synchrotron radiation for scattering Mössbauer spectrometry are compared with those of radioisotope source.