1994 Volume 32 Issue 5 Pages 249-254
Residual stress distribution at ceramic side in Si3N4/SUS304 joint specimens were quantitatively measured by X-ray diffraction method.
Distributions of perpendicular and parallel stresses in perpendicular and parallel directions to the interface were successfully measured. It was found that the perpendicular stress concentrated near the interface. The most dominant residual stress to the fracture of joints was considered to be the highest tensile stress at the edge of interface. Mesurement error of X-ray diffraction method was discussed. It is concluded that the X-ray diffraction method can not be used in the investigation of stress singularity near the interface, although it is effective in determining the distribution of residual stresses.
