IEEJ Transactions on Electronics, Information and Systems
Online ISSN : 1348-8155
Print ISSN : 0385-4221
ISSN-L : 0385-4221
<Optoelectronics & Quantum Electronics>
Nondestructive Inspection by Using Scattering and Spectra in Terahertz Waves
Takayuki ShibuyaMasahiro YamashitaYuichi OgawaChiko OtaniKodo KawaseHiroyuki InoueTatsuyuki Kanamori
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2005 Volume 125 Issue 4 Pages 545-550

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Abstract

In this paper, we show that the nondestructive detection of chemicals hidden in envelopes can be achieved using terahertz waves in a simple two-step procedure: First, scattering of the terahertz waves is an indicator of the presence of powders in the envelope; second, the identification of the chemicals is done by spectral fingerprinting. In addition, we examined the possibility of measurement by diffuse reflection.

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© 2005 by the Institute of Electrical Engineers of Japan
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