IEEJ Transactions on Electronics, Information and Systems
Online ISSN : 1348-8155
Print ISSN : 0385-4221
ISSN-L : 0385-4221
<Optics, Quantum Electronics>
Micromachining of Silica Glass Using EUV Radiation of Laser-Produced Plasma
Akihiko TakahashiShuichi ToriiTetsuya MakimuraKouichi MurakamiKota OkazakiDaisuke NakamuraTatsuo OkadaHiroyuki Niino
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2010 Volume 130 Issue 10 Pages 1779-1783

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Abstract
We are investigating the micromachining of silica glass using extreme ultraviolet (EUV) light from laser-produced plasma (LPP). The present investigation deals with the ablation using EUV light of around 13.5 nm and 11 nm generated in laser-produced Sn plasma and Xe plasma, respectively. CO2 laser and Nd:YAG lasers were used as pump lasers. The EUV radiation was focused on the surface of silica glass through the meshed mask using an ellipsoidal mirror coated with gold film. The results showed that the silica glass was successfully ablated by EUV light from the Nd:YAG-LPP. The maximum ablation rate was 42 nm per shot for 11-nm light, and 25 nm per shot for 13.5-nm light. On the other hand, EUV radiation from the CO2-LPP did not ablate the silica glass. This is presumably caused by the lower EUV irradiation intensity due to the long pulse duration of the CO2 laser.
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© 2010 by the Institute of Electrical Engineers of Japan
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