IEEJ Transactions on Electronics, Information and Systems
Online ISSN : 1348-8155
Print ISSN : 0385-4221
ISSN-L : 0385-4221
<Electrical and Electronic Circuit, LSI>
A Vulnability Evaluation Method against Power Analisys Attack on Gate-level Design Phase
Toshiya AsaiMitsuru ShiozakiTakeshi FujinoMasaya Yoshikawa
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2013 Volume 133 Issue 5 Pages 947-956

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Abstract
Electronic devices handling confidential information, such as IC cards, are secured by encrypting data. The encryption standard, which has been widely diffused in recent years, is certified that its decryption is computationally impossible. However, although an encryption algorithm is theoretically secured, when the algorithm is incorporated into hardware, confidential information about the algorithm could be improperly specified by analyzing power consumption that is generated during cipher processing. Therefore, when an encryption algorithm is incorporated into hardware, it is important to evaluate the resistance against power analysis attacks in the design stages. This paper proposes a new vulnerability evaluation for power analysis attacks. The proposed method can not only achieve a high-speed, highly accurate verification but also quantitatively evaluates a weak part. Experimental results prove the validity of the proposed tamper resistant analysis method.
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© 2013 by the Institute of Electrical Engineers of Japan
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