IEEJ Transactions on Electronics, Information and Systems
Online ISSN : 1348-8155
Print ISSN : 0385-4221
ISSN-L : 0385-4221
<Electronic Materials and Devices>
Surface Temperature Dependence on AlN Film Formation Processes Induced by Supersonic N2 Molecular Beam
Yuden TeraokaMuneaki JinnoTsuyoshi TakaokaJames Robert HarriesRyuta OkadaYutaro IwaiAkitaka YoshigoeTadahiro Komeda
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2014 Volume 134 Issue 4 Pages 524-525

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Abstract
Surface temperature dependence on the translational energy induced nitridation of Al(111) has been investigated by using synchrotron radiation photoemission spectroscopy. Incubation time for N1s photoemission onset was found to be longer at lower temperatures than 473 K, indicating precursor formation followed by proper nitridation. The major product is the three-fold N atom. The minor four-fold one decreased at higher temperatures. Three step reaction mechanisms, that is, translational energy induced nitridation, precursor formation, and proper nitridation of the precursor states, were presented.
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© 2014 by the Institute of Electrical Engineers of Japan
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