IEEJ Transactions on Electronics, Information and Systems
Online ISSN : 1348-8155
Print ISSN : 0385-4221
ISSN-L : 0385-4221
<Electrical and Electronic Circuit, LSI>
Practical Evaluation of GaN Heterojunction-Field-Effect-Transistor (HFET)-applied Zero Voltage Soft-Switching Resonant Converter for Inductive Power Transfer
Eitaro MoritaTomokazu Mishima
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2016 Volume 136 Issue 11 Pages 1511-1518

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Abstract

This paper presents a novel prototype of a soft-switching resonant dc-dc power converter with high breakdown-voltage Gallium Nitride Heterojunction-Field-Effect-Transistor (GaN-HFET) for inductive power transfer (IPT) systems. The edge-resonant zero voltage soft-switching (ZVS) operation using lossless snubbing capacitors is essential for effective reduction of switching power losses and noises with low threshold voltage of the GaN-HFET. The excellent performances such as high efficiency, low switching noises and normally-off operation are originally demonstrated in experiment of a 950W prototype by comparing with a super-junction (SJ)-MOSFET based prototype under the fair conditions of breakdown-voltage and current rating. The feasibility of GaN-HFET-applied IPT-ZVS converter is discussed from a practical point of view.

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© 2016 by the Institute of Electrical Engineers of Japan
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