Adjacent Defects Detection using a Sparse Modeling of Ultrasonic Testing System

Abstract

When the distance between internal defects is short during ultrasonic flaw detection, each reflected wave may be observed as a composite wave in the observed waveform. In this paper, we confirmed that it is possible to separate the reflected waves from each defect by using sparse modeling for such synthetic waves. It was also found that the resolution can be improved by comparing the resolution with deconvolution, which is one of the existing signal processing methods.