The transactions of the Institute of Electrical Engineers of Japan.C
Online ISSN : 1348-8155
Print ISSN : 0385-4221
The deterioration of CCD line sensor irradiated with-low-energy X-rays
Yoshio Higashiyama, Shohji Nishioka, Shigemasa Enomoto
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1986 Volume 106 Issue 9 Pages 198

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