BEM Analysisof X-ray Scattering due to Dielectric Boundary Surface of Multiple Atoms Model

Abstract

Recently X-rays are the focus of the next generation technologies. The development of X-ray optics, with the advent of the UNDULATOR such as SOR (Synchrotron Orbital Radiation), has been remarkable. X-ray optical devices are forced to step up the efficiency, and lenses, reflection mirrors and guides are being studied in the X-ray active region. In this paper scattering analysis is carried out by using wavelength of X-ray, and parameters such as radius of atoms, distance between atoms, angle of incidence X-ray. The model of atoms are considered to be cylindrical perfect conductor and dielectric, and we considered up to 15×15 cylinders using calculations based on the BEM technique.