Investigation of Virtual Reality Interface for AFM-based Nano Manipulation

Abstract

Nano manipulation technology using Scanning Probe Microscope such as Atomic Force Microscope (AFM) has been introduced recently. Nano world physics is different from the macro world such that the gravity can be ignored and the in fluences of the capillary force or the Van der Waals force are dominant. Furthermore, since the scale is different, the tip control in the z direction is important for not breaking the tip and samples. Depending on the experimental results, the visualization of the force value is important to control the z position. For reliable and easy nano manipulation, user interface is very crucial. The ideal interface characteristics for nano scale manipulation is discussed in this paper.