Host: The Illuminating Engineering Institute of Japan
The sealing glass of a fluorescent lamp tube is sometimes meltdown at the end-of-life when it operated by the electronic ballasts composed of a resonance oscillation circuit. In this study, the phenomena of the electrode at the end-of-life are investigated. Two mechanisms are existed for breakdown of the coil-electrode. The meltdown of sealing glass is caused by the current flowing through the capacitor for resonance oscillation after the coil-electrode breakdown.