International Journal of the Society of Materials Engineering for Resources
Online ISSN : 1884-6629
Print ISSN : 1347-9725
ISSN-L : 1347-9725
Electron Phase Microscopy for Superconductors
Akira TONOMURA
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1995 Volume 3 Issue 1 Pages 11-18

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Abstract
Phase distribution in an electron beam can now be precisely measured towithin 1/100th of the electron wavelength using both electron holography anda “coherent” field-emission electron beam. This technique allows for theultra-fine measurement of material structures and electromagnetic fild distributionson a microscopic scale. Flux lines in a superconducting thin film can beobserved quantitatively by electron-holographic interference microscopy anddynamically by Lorentz microscopy.
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© The Society of Materials Engineering for Resources of JAPAN
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