Abstracts for ILCAJ meeting
The 3rd meeting of the institute of Life Cycle Assessment, Japan
Session ID : C2-03
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Host: The Institute of Life Cycle Assessment, Japan

Environmental burden of memory LSI test system
*Norifumi CHIBA, Katsuji EBISU
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Keywords: Memory LSI test system, Life Cycle Assessment, Environmental burden, Eco-efficiency, Semiconductor testing equipment
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[in Japanese]

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© 2007 The Institute of Life Cycle Assessment, Japan
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