DENSHI SHASHIN GAKKAISHI (Electrophotography)
Online ISSN : 1880-5108
Print ISSN : 0387-916X
ISSN-L : 0387-916X
A Study of Gap State Profiles and Light-Induced Fatigue in Amorphous Selenium
Yoshihiko KANEMITSUShunji IMAMURAKazuhiro KOSEKI
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1990 Volume 29 Issue 1 Pages 26-31

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Abstract
We have studied gap state profiles and light-induced fatigue in amorphous selenium (a-Se) by means of xerographic discharge measurements. Prolonged illumination increases the density of charged defects in a-Se. Nature of charged defects created by light exposure is similar to that of native structural defects D+ and D- . The formation of charged defects is enhanced by light illumination of photon energy equal to the band gap of a-Se. In addition, the creation efficiency of photo-induced charged defects under an applied electric field is small compared with that under zero field. These experimental results imply that the geminate recombination of electron-hole pairs plays an important role in the creation process of charged defects, D+ and D- in a-Se.
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© 1990 by The Imaging Society of Japan
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