Abstract
Photoconductor resolution is known to deteriorate due to enviromental changes, such as temperature and humidity, and long-time printing. It is argued that the deterioration of resolution is caused by diffusion of electrical charges on photoconductor surface. To confirm this conjecture, measurements of temporal changes in latent images on organic potoconductors were performed by making use of the newly developed high-resolution latent image measuring system. From the measured results, an equivalent circuit model of organic photoconductor was proposed and temporal changes in latent images were simulated. Measured results were in good agreement with the simulated results. Based on these results a now technique was proposed to estimate surface resistance, and resolution of photoconductors was discussed.
