A Surface Potential Sensor Probe with Limit Effect

Abstract

A probe is used for a non-contact measurement of the surface potential of photoconductors in printers and copiers. A new probe with limit effect was developed. The sensor was located at the side of the guard-case so that a beam of exposure can go into from the back and reach the photoconductor directly through the open window (aperture). Since a transparent electrode is not used, the partial absorption or the reflection of lights does not occur. We confirmed the measurement is done only in the area just under the window. We also confirmed the measurement depends little on the gap between our probe and the photoconductor. Moreover we analyzed several properties of our probe the oretically, using the map of electric lines of force obtained by the experiment called 'fulid mapper'.