Influence of Structural Properties of TPD Thin Films on EL Properties of Organic EL Devices

Abstract

Surface morphology of TPD thin films has been observed by Atomic Force Microscopy (AFM). It was found that the morphology depends on significantiy the deposition rate of the TPD films, and there exist the optimum region of the deposition rate to obtain flat surface. Furthermore, it was found that maximum luminance has a close relationship to the surface morphology of TPD thin films.