10-10 LCD輝度ムラ自動測定器の開発

棚橋 高成; 高地 正夫

doi:10.11485/iteac.2001.0_134

PROCEEDINGS OF THE ITE ANNUAL CONVENTION

Online ISSN : 2424-2292
Print ISSN : 1343-1846
ISSN-L : 1343-1846

2001

Session ID : 10-10

DOI https://doi.org/10.11485/iteac.2001.0_134

Conference information

Name : 2001 ITE Annual Convention

Location : [in Japanese]

Date : August 27, 2001 - August 29, 2001

10-10 Development of automated MURA measurement system in Liquid Crystal Displays

K. Tanahashi, M. Kohchi

Author information

CONFERENCE PROCEEDINGS FREE ACCESS

Details

Abstract

Measured method for nonuniform brightness regions in Liquid Crystal Display (LCD) was discussed. Extraction of uniformity as the front of screen quality was successfully completed using developed algorithm. Its technology can be applicable to automatic inspection of display quality in LCD or PC manufacturing.

Content from these authors

Favorites & Alerts

Corresponding author

Register with J-STAGE for free!