PROCEEDINGS OF THE ITE ANNUAL CONVENTION
Online ISSN : 2424-2292
Print ISSN : 1343-1846
ISSN-L : 1343-1846
2010
Session ID : 5-11
Conference information

5-11 Design of Polarization-Analyzing Image Sensor in 65nm CMOS Process
Sanshiro SHISHIDOToshihiko NODAKiyotaka SASAGAWATakashi TOKUDAJun OHTA
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CONFERENCE PROCEEDINGS FREE ACCESS

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Abstract
To realize a miniaturization of the sensor chip for μTAS system, we propose a polarization analyzing image sensor using 65nm CMOS process for the first time. We describe the design details and characterization of our proposed CMOS image sensor. By the fabricated sensor, polarization property is successfully measured.
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© 2010 The Institute of Image Information and Television Engineers
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