Bit Depth Analysis Based on the Barten Model for High Quality FPDs

Abstract

We propose a method of bit depth analysis that promotes a deeper understanding of the "45dB curse": a widely accepted but usually misunderstood 45dB PSNR criterion for image compression. Our analysis illustrates useful guidelines to further investigate lowering the cost of high-quality display peripheral devices. The Barten model accurately predicts our 2AFC experimental results.