Characterization of Vacuum Evaporated MgO Thin-Films for Protecting Layer of ac-PDPs

Hiroki Shinoda; Takayoshi Hirakawa; Takayuki Tezuka; Heiju Uchiike

doi:10.11485/itetaikai.2003s.0.56.0

PROCEEDINGS OF THE 2003 ITE ANNUAL CONVENTION

Session ID : 7-6

DOI https://doi.org/10.11485/itetaikai.2003s.0.56.0

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Host: THE INSTITUTE OF IMAGE INFORMATION AND TELEVISION ENGINEERS

Characterization of Vacuum Evaporated MgO Thin-Films for Protecting Layer of ac-PDPs

*Hiroki Shinoda, Takayoshi Hirakawa, Takayuki Tezuka, Heiju Uchiike

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Abstract

The insulation of protecting materials is required to maintain high wall voltage.In order to characterize the insulation of MgO used as protecting material of ac-PDPs,oxygen was added during vacuum evaporation.It is proved that the addition of oxygen has an influence upon the insulation of MgO thin-films as well as ri.

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