Abstract
Perpendicular magnetic anisotropy (PMA) at room temperature in Ni/Pt multilayer thin films were obtanined for the samples of constant-3-Å Pt and 9〜16 Å Ni sublayer thicknesses, prepared by sequential dc magnetron sputter deposition. Accurate stress and magnetostriction measurements revealed that stress-induced magnetoelastic anisotropy was a major origin for the observed PMA in this system.
