Abstract
Local structural anisotropy of RE/TM multilayers prepared under different conditions was investigated by using extended X-ray absorption fine structure (EXAFS) spectroscopy to estimate the correlation between Perpendicular magnetic anisotropy and local structural anisotropy. Fourier transformed Fe-EXAFS indicated the difference between atomic pair ordering aligning in the film plane and film normal, showing the existence of structural anisotropy. It was found that the variation of the structural anisotropy well corresponds to that of the perpendicular magnetic anisotropy, both of which change depending on the bilayer period and the preparation condition.
