Abstract
In the fabrication process of TFT-LCD, the screen inspection before mounting of driving LSI is necessary for improving its productivity. A conventional screen inspection was carried out by temporarily connecting many probes to the corresponding electrodes on LCD panel. But this conventional method has some problem such as poor productivity by adjusting the position of the probes quite precisely, expensiveness by remaking the new probes for every LCD panel and maintaining the probes themselves. In this report, we will introduce the simplified screen inspection method which has resolved the above mentioned problems.
