A two-frequency phase-shifting projection moire method particularly intended for high-speed three-dimensional shape reconstruction of diffuse objects is presented. Emphasis is on realization of phase-shifting fringe analysis in projection moire topography using a set of line grating pairs designed to provide different phase shifts in sequence. Adopting phase-shifting technique in moire topography provides many advantages in measuring complex surface profiles with varying reflectance. However, still the so called 2π-ambiguity problem remains, which limits the maximum measurable step height difference between two neighboring sample points to be less than half the equivalent wavelength of moire fringes. To cope with the problem in this investigation, a two-wavelength scheme of projection moire topography is proposed along with necessary hardware design considerations. Further a time-integral fringe capturing scheme is devised to remove undesirable high frequency original grating patterns in realtime without time-consuming software image processing. Finally the performances of the proposed method are discussed with measurement results.