ITE Technical Report
Online ISSN : 2424-1970
Print ISSN : 1342-6893
ISSN-L : 1342-6893
25.46
Session ID : IDY2001-115
Conference information
P-2: Improvement of Electrical Stability in the Poly-Si TFTs with Air Cavities at the Edges of the Gate Oxide(Poster Session)(Report on 2001 SID)
M.C. Lee, S.H. Jung, W.J. Nam, J.H. Lee, M.K. Han
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© 2001 The Institute of Image Information and Television Engineers
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