Abstract
We have been investigating a new technique of on-sensor analog to digital conversion. In this paper, we describe a new 64×32 pixels A/D conversion image sensor. In this sensor, small 1bit comparators detect each bit of pixel value by using non-destructive readout in column parallel, repeatedly. We have fabricated the second prototype by 2-poly 2-metal 0.8 μm CMOS process. We describe the processing scheme of our ADC, simulation results, and the circuits design of the second prototype. We show results of some experiments obtained by the prototype.
