An Analog Integrated Circuit Based on Vertebrate Outer Retina with Superior Tolerance for the MOS Transistor Mismatch

Abstract

We have improved the tolerance of the edge detection network based on vertebrate outer retina for the threshold voltage and current factor variations of MOS transistors. Simulation results using the simulation program with integrated circuit emphasis (SPICE) indicated the weak tolerance of the edge detection network for the threshold voltage and current factor variations The novel edge detection circuit constructed with a feedback circuit that has superior tolerance for the MOS transistor mismatch. As a result of simulations, reduced influence for the variation of threshold voltage and the current factor was confirmed.