ITE Technical Report
Online ISSN : 2424-1970
Print ISSN : 1342-6893
ISSN-L : 1342-6893
32.26
Session ID : IST2008-31/ME2008-89
Conference information
Examination material analysis using industrual X-ray CT image
Yuukou HORITATakashi KOBAYASHITetsuo AIDAKeiji SHIBATAYasuhiro INAZUMI
Author information
CONFERENCE PROCEEDINGS FREE ACCESS

Details
Abstract
Porus metals from which the application is expected as the next generation material has the pore internally. This material invents various characteristics with the pore. However, it is difficult to see an internal pore visually. Then, detailed pored information can be acquired as CT image by using it with X-rays CT device so far. Pore's feature and the material's characteristic are related in analyzing the CT image by using the image processing. This time, the Pore volume and the Pore relative density were obtained by analysing the CT image. As a result, it was proven to be a very useful.
Content from these authors
© 2008 The Institute of Image Information and Television Engineers
Previous article Next article
feedback
Top