Improve of secondary electron emission property of MgO protective layer by impurity addition

Abstract

MgO based protective layers with finite secondary electron emission coefficient by Xe^+, γ(Xe), are synthesized and their effect on firing voltage is measured in AC-PDPs. It is measured that the slight increase of γ(Xe) by an order of 0.01 reduces the firing voltage and that the reduction becomes larger at higher Xe content.