ITE Technical Report
Online ISSN : 2424-1970
Print ISSN : 1342-6893
ISSN-L : 1342-6893
33.23
Session ID : IST2009-26/ME2009-10
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The development to a sensor of RF CMOS technology : Measurement System on Chip
Akio KITAGAWA
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CONFERENCE PROCEEDINGS FREE ACCESS

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Abstract
The RF/AMS-CMOS technology begins to have an impact on the leading-edge sensor technology. The trend of CMOS technology is surveyed in terms of the novel sensor and the measurement system on chip. For example, the free radical sensor, nano-displacement sensor, excretion-monitoring sensor is reported.
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© 2009 The Institute of Image Information and Television Engineers
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