A Global-Shutter CMOS Image Sensor with In-Pixel Dual Storage

Abstract

In this paper, we report a Global-Shutter CMOS Image Sensor with no picture distortion which caused due to line-scanned exposure. The midpoint potential drive technique enables the signal adaptive separation to MEM and FD, respectively. These signals are readout by using same Single-Slope ADC(SS-ADC) with operation range adjustment technique. The additional ADC circuit area is enough small to maintain the SS-ADC advantages. The enhanced dynamic range of 83.0dB is achieved by appropriate signal processing without influence of kT/C noise.