ITE Technical Report
Online ISSN : 2424-1970
Print ISSN : 1342-6893
ISSN-L : 1342-6893
41.12 Artistic Image Technology(AIT)
Session ID : AIT2017-54
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Visual Simulation of Fine-particles Taking Yield Criteria into Account
*Shuto SHIKAMA, Genichi KAWADA, Issei FUJISHIRO
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Abstract
Fine particles are defined as a mass of solid particles whose radii are smaller than 200µm. In particular, finer particles with radius smaller than 100µm are called adhesive fine particles, because those particles tend to adhere to one another. Adhesive fine particles are ubiquitous in our daily life; four and powdered medicine are good examples of those. In this study, we attempted to model the behavior of adhesive fine-particles, which had never been reported in the literature. First, we adopted a representative particle model to narrow the dynamic range of the computation, though the existing model itself does not take inner frictions into account, which motivated us to allow each of the particles to hold its yield criteria. Our method successfully reduced the computational complexity and realized a feasible simulation of characteristic cracks on the surface of adhesive fine particles.
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© 2021 The Institute of Image Information and Television Engineers
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